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Combined Analyses of STEM and APT for Nano-scale Phase Identification in Advanced Materials and Devices.
- Title
- Combined Analyses of STEM and APT for Nano-scale Phase Identification in Advanced Materials and Devices.
- Date Issued
- 2012-02-05
- Publisher
- APMC
- Article Type
- Conference
- Citation
- APMC 2012, 2012-02-05
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg