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Possibility of Electron Beam Damage on the InGaN Well Layers of LED Evaluated by Atom Probe Tomography
- Title
- Possibility of Electron Beam Damage on the InGaN Well Layers of LED Evaluated by Atom Probe Tomography
- Date Issued
- 2012-03-11
- Publisher
- TMS
- Article Type
- Conference
- Citation
- TMS 2012, 2012-03-11
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg