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An Experimental Study on Channel Backscattering in High-k/Metal Gate nMOSFETs
- Title
- An Experimental Study on Channel Backscattering in High-k/Metal Gate nMOSFETs
- Authors
- 정윤하
- Date Issued
- 2012-10-14
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- 2012 IEEE International Integrated Reliability Workshop, 2012-10-14
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg