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Superior Recovery Characteristics of SiGe pMOSFETs under NBTI Stress
- Title
- Superior Recovery Characteristics of SiGe pMOSFETs under NBTI Stress
- Authors
- 정윤하
- Date Issued
- 2012-09-25
- Publisher
- The Japan Society of Applied Physics
- Article Type
- Conference
- Citation
- 2012 International Conference on Solid State Devices and Materials, 2012-09-25
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg