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TiOx Layer Engineering for Producing Non-Linear Characteristic in HfOx-based Resistive Random Access Memory
- Title
- TiOx Layer Engineering for Producing Non-Linear Characteristic in HfOx-based Resistive Random Access Memory
- Authors
- 황현상
- Date Issued
- 2012-12-06
- Publisher
- 43rd IEEE Semiconductor Interface Specialists Conference
- Article Type
- Conference
- Citation
- 43rd IEEE Semiconductor Interface Specialists Conference, 2012-12-06
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Related Researcher
- 황현상HWANG, HYUNSANG
- Dept of Materials Science & Enginrg