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Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Title
- Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Date Issued
- 2013-06-24
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- Device Research Conference, 2013-06-24
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg