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Probing the Surface of Semiconductor Nanocrystals by Mass Spectrometric Imaging
- Title
- Probing the Surface of Semiconductor Nanocrystals by Mass Spectrometric Imaging
- Authors
- 신승구
- Date Issued
- 2011-02-18
- Publisher
- Korean Society for Mass Spectrometry
- Article Type
- Conference
- Citation
- 2011 Korean Society for Mass Spectrometry Winter Workshop, 2011-02-18
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Related Researcher
- 신승구SHIN, SEUNG KOO
- Dept of Chemistry