Nanoscale (~10nm) 3D Vertical ReRAM and NbO2 Threshold Selector with TiN Electrode
- Title
- Nanoscale (~10nm) 3D Vertical ReRAM and NbO2 Threshold Selector with TiN Electrode
- Authors
- 황현상
- Date Issued
- 2013-12-10
- Publisher
- IEEE Electron Devices Society
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/65367
- Article Type
- Conference
- Citation
- 2013 IEEE International Electron Devices Meeting(IEDM), 2013-12-10
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.