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Nanoscale (~10nm) 3D Vertical ReRAM and NbO2 Threshold Selector with TiN Electrode

Title
Nanoscale (~10nm) 3D Vertical ReRAM and NbO2 Threshold Selector with TiN Electrode
Authors
황현상
Date Issued
2013-12-10
Publisher
IEEE Electron Devices Society
URI
https://oasis.postech.ac.kr/handle/2014.oak/65367
Article Type
Conference
Citation
2013 IEEE International Electron Devices Meeting(IEDM), 2013-12-10
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