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Study on nano-scale threshold switching behavior of NbOx film for ReRAM selector application
- Title
- Study on nano-scale threshold switching behavior of NbOx film for ReRAM selector application
- Authors
- 황현상
- Date Issued
- 2013-09-27
- Publisher
- THE JAPAN SOCIETY OF APPLIED PHYSICS
- Article Type
- Conference
- Citation
- 2013 International Conference on Solid State Devices and Materials(SSDM), 2013-09-27
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Related Researcher
- 황현상HWANG, HYUNSANG
- Dept of Materials Science & Enginrg