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DC and Thermal Noise Modeling of 20 nm Double-Gate Junctionless MOSFETs
- Title
- DC and Thermal Noise Modeling of 20 nm Double-Gate Junctionless MOSFETs
- Authors
- 정윤하
- Date Issued
- 2013-06-23
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- 22nd International Conference on Noise and Fluctuations, 2013-06-23
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg