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Comparative Study of Geometry-dependent Capacitances of Planar FETs and Double-Gate FinFETs: Optimization and Process Variation
- Title
- Comparative Study of Geometry-dependent Capacitances of Planar FETs and Double-Gate FinFETs: Optimization and Process Variation
- Authors
- 정윤하
- Date Issued
- 2012-04-24
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- International Symposium on VLSI Technology, Systems and Applications, 2012-04-24
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg