Full metadata record
DC Field | Value | Language |
dc.contributor.author | 이정수 | - |
dc.date.accessioned | 2018-06-18T09:54:01Z | - |
dc.date.available | 2018-06-18T09:54:01Z | - |
dc.date.created | 2014-03-05 | - |
dc.date.issued | 2013-07-12 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/65666 | - |
dc.publisher | 5th International Symposium on IT convergence Engineering | - |
dc.relation.isPartOf | 5th International Symposium on IT convergence Engineering | - |
dc.relation.isPartOf | 5TH INTERNATIONAL SYMPOSIUM ON IT CONVERGENCE ENGINEERING | - |
dc.title | Silicidation for Forming Low Contact Resistance of Ohmic Contact on 4H-SiC using Ni and Ti/Ni Layer | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 5th International Symposium on IT convergence Engineering | - |
dc.citation.conferenceDate | 2013-07-11 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 5th International Symposium on IT convergence Engineering | - |
dc.contributor.affiliatedAuthor | 이정수 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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