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Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects

Title
Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
Authors
이정수
Date Issued
2013-06-25
Publisher
71st Annual Device Research Conference
URI
https://oasis.postech.ac.kr/handle/2014.oak/65677
Article Type
Conference
Citation
71st Annual Device Research Conference, 2013-06-25
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이정수LEE, JEONG SOO
Dept of Electrical Enginrg
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