Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
- Title
- A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
- Date Issued
- 2014-02-10
- Publisher
- IEEE International Solid-State Circuits Conference(ISSCC)
- Article Type
- Conference
- Citation
- IEEE International Solid-State Circuits Conference(ISSCC), 2014-02-10
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 박홍준PARK, HONG JUNE
- Dept of Electrical Enginrg