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A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology

Title
A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
Authors
박홍준한승호이수은최민수심재윤김병섭
Date Issued
2014-02-10
Publisher
IEEE International Solid-State Circuits Conference(ISSCC)
URI
https://oasis.postech.ac.kr/handle/2014.oak/65756
Article Type
Conference
Citation
IEEE International Solid-State Circuits Conference(ISSCC), 2014-02-10
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박홍준PARK, HONG JUNE
Dept of Electrical Enginrg
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