A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
- Title
- A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
- Authors
- 박홍준; 한승호; 이수은; 최민수; 심재윤; 김병섭
- Date Issued
- 2014-02-10
- Publisher
- IEEE International Solid-State Circuits Conference(ISSCC)
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/65756
- Article Type
- Conference
- Citation
- IEEE International Solid-State Circuits Conference(ISSCC), 2014-02-10
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.