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Analysis of charge traps related to bias-stress stability of organic transistors

Title
Analysis of charge traps related to bias-stress stability of organic transistors
Authors
조길원
Date Issued
2013-08-25
Publisher
SPIE
URI
https://oasis.postech.ac.kr/handle/2014.oak/65880
Article Type
Conference
Citation
SPIE 2013, 2013-08-25
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조길원CHO, KIL WON
Dept. of Chemical Enginrg
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