Analysis of charge traps related to bias-stress stability of organic transistors
- Title
- Analysis of charge traps related to bias-stress stability of organic transistors
- Authors
- 조길원
- Date Issued
- 2013-08-25
- Publisher
- SPIE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/65880
- Article Type
- Conference
- Citation
- SPIE 2013, 2013-08-25
- Files in This Item:
- There are no files associated with this item.
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