Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Title
- Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Authors
- 백창기
- Date Issued
- 2013-06-26
- Publisher
- DRC
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/66296
- Article Type
- Conference
- Citation
- 2013 Annual Device Research Conference (DRC), 2013-06-26
- Files in This Item:
- There are no files associated with this item.
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