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Usage-Based Degradation of SRAM Array due to Bias Temperature Instability
- Title
- Usage-Based Degradation of SRAM Array due to Bias Temperature Instability
- Authors
- 김재준; Aditya Bansal; Rahul Rao
- Date Issued
- 2012-04-18
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE International Reliability Physics Symposium (IRPS), page. 6.1 - 6.4, 2012-04-18
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Related Researcher
- 김재준KIM, JAE JOON
- Dept. Convergence IT Engineering