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Contact-Resistance Scaling Characteristics of Phase Change Memory in GeTe and Ge2Sb2Te5 Nanowires
- Title
- Contact-Resistance Scaling Characteristics of Phase Change Memory in GeTe and Ge2Sb2Te5 Nanowires
- Authors
- 조문호
- Date Issued
- 2012-11-26
- Publisher
- materials research society
- Article Type
- Conference
- Citation
- 2012 Fall Materials Research Society (MRS) Meeting, 2012-11-26
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Related Researcher
- 조문호JO, MOON HO
- Dept of Materials Science & Enginrg