Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박찬경 | - |
| dc.contributor.author | 장동현 | - |
| dc.contributor.author | 이지현 | - |
| dc.date.accessioned | 2018-06-18T11:12:01Z | - |
| dc.date.available | 2018-06-18T11:12:01Z | - |
| dc.date.created | 2014-04-08 | - |
| dc.date.issued | 2013-08-04 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/67029 | - |
| dc.publisher | TMS | - |
| dc.relation.isPartOf | PRICM 8 | - |
| dc.title | Atom probe study on the adhesion property and compositional variation in W/poly–Si NAND gate structure with inter-control layer | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | PRICM 8 | - |
| dc.citation.title | PRICM 8 | - |
| dc.contributor.affiliatedAuthor | 박찬경 | - |
| dc.contributor.affiliatedAuthor | 장동현 | - |
| dc.contributor.affiliatedAuthor | 이지현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg