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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 문원규 | - |
| dc.contributor.author | 신금재 | - |
| dc.contributor.author | 이훈택 | - |
| dc.contributor.author | 성민 | - |
| dc.date.accessioned | 2018-06-18T11:33:48Z | - |
| dc.date.available | 2018-06-18T11:33:48Z | - |
| dc.date.created | 2014-11-26 | - |
| dc.date.issued | 2014-07-02 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/67372 | - |
| dc.publisher | international scanning probe microscopy | - |
| dc.relation.isPartOf | A study on the measurement of the electromagnetic properties of a dielectric surface using a FET-mounted probe | - |
| dc.relation.isPartOf | A STUDY ON THE MEASUREMENT OF THE ELECTROMAGNETIC PROPERTIES OF A DIELECTRIC SURFACE USING A FET-MOUNTED PROBE | - |
| dc.title | A study on the measurement of the electromagnetic properties of a dielectric surface using a FET-mounted probe | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | A study on the measurement of the electromagnetic properties of a dielectric surface using a FET-mounted probe | - |
| dc.citation.conferenceDate | 2014-06-29 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | A study on the measurement of the electromagnetic properties of a dielectric surface using a FET-mounted probe | - |
| dc.contributor.affiliatedAuthor | 문원규 | - |
| dc.contributor.affiliatedAuthor | 신금재 | - |
| dc.contributor.affiliatedAuthor | 이훈택 | - |
| dc.contributor.affiliatedAuthor | 성민 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 문원규MOON, WON KYU
- Dept of Mechanical Enginrg