A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology
- Title
- A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology
- Authors
- 박홍준; 한승호; 이수은; 최민수; 심재윤; 김병섭
- Date Issued
- 2014-02-12
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/68104
- Article Type
- Conference
- Citation
- 2014 IEEE International Solid-State Circuits Conference (ISSCC), 2014-02-12
- Files in This Item:
- There are no files associated with this item.
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