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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백창기 | - |
| dc.date.accessioned | 2018-06-19T00:05:53Z | - |
| dc.date.available | 2018-06-19T00:05:53Z | - |
| dc.date.created | 2015-02-19 | - |
| dc.date.issued | 2012-07-26 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/68458 | - |
| dc.publisher | ICSNN council | - |
| dc.relation.isPartOf | International Conference on Superlattices, Nanostructures, and Nanodevice | - |
| dc.title | Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Conference on Superlattices, Nanostructures, and Nanodevice | - |
| dc.citation.conferencePlace | GE | - |
| dc.citation.title | International Conference on Superlattices, Nanostructures, and Nanodevice | - |
| dc.contributor.affiliatedAuthor | 백창기 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering