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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백창기 | - |
| dc.date.accessioned | 2018-06-19T00:06:02Z | - |
| dc.date.available | 2018-06-19T00:06:02Z | - |
| dc.date.created | 2015-02-19 | - |
| dc.date.issued | 2011-08-17 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/68461 | - |
| dc.publisher | IEEE Nanotechnology Council | - |
| dc.relation.isPartOf | 2011 11th IEEE International Conference on Nanotechnology | - |
| dc.title | Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2011 11th IEEE International Conference on Nanotechnology | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | 2011 11th IEEE International Conference on Nanotechnology | - |
| dc.contributor.affiliatedAuthor | 백창기 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering