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Comparative study of C-V characteristics in Si-NWFET and MOSFET

Title
Comparative study of C-V characteristics in Si-NWFET and MOSFET
Authors
백창기
Date Issued
2010-10-13
Publisher
IEEE Nanotechnology Materials and Devices Conference
URI
https://oasis.postech.ac.kr/handle/2014.oak/68467
Article Type
Conference
Citation
2010 IEEE Nanotechnology Materials and Devices Conference, 2010-10-13
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백창기BAEK, CHANG KI
Dept. Convergence IT Engineering
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