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Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f Noise Model
- Title
- Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f Noise Model
- Authors
- 백창기
- Date Issued
- 2010-02-25
- Publisher
- 한국반도체학술대회
- Article Type
- Conference
- Citation
- 제17회 한국반도체학술대회, 2010-02-25
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