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A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology

Title
A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology
Authors
한승호이수은최민수심재윤박홍준김병섭
Date Issued
2014-02-10
Publisher
IEEE
URI
https://oasis.postech.ac.kr/handle/2014.oak/68480
Article Type
Conference
Citation
International Solid-State Circuits Conference, page. 50 - 51, 2014-02-10
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김병섭KIM, BYUNGSUB
Dept of Electrical Enginrg
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