A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology
- Title
- A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology
- Authors
- 한승호; 이수은; 최민수; 심재윤; 박홍준; 김병섭
- Date Issued
- 2014-02-10
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/68480
- Article Type
- Conference
- Citation
- International Solid-State Circuits Conference, page. 50 - 51, 2014-02-10
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.