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Direct mapping of strain state in epitaxial InGaN/GaN Multilayers using Dark-field Inline Electron Holography
- Title
- Direct mapping of strain state in epitaxial InGaN/GaN Multilayers using Dark-field Inline Electron Holography
- Date Issued
- 2014-09-07
- Publisher
- IMC
- Article Type
- Conference
- Citation
- 10th International Microscopy Congress 2014, 2014-09-07
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Related Researcher
- 오상호OH, SANG HO
- Dept of Materials Science & Enginrg