Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Improvement in Reliability Characteristics (retention and endurance) of RRAM by using High-Pressure Hydrogen Annealing
- Title
- Improvement in Reliability Characteristics (retention and endurance) of RRAM by using High-Pressure Hydrogen Annealing
- Authors
- 황현상
- Date Issued
- 2014-06-08
- Publisher
- IEEE Electron Devices Society
- Article Type
- Conference
- Citation
- 2014 IEEE Silicon Nanoelectronics Workshop, 2014-06-08
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.