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dc.contributor.author강병우-
dc.contributor.author유선영-
dc.contributor.author김정한-
dc.date.accessioned2018-06-19T01:13:12Z-
dc.date.available2018-06-19T01:13:12Z-
dc.date.created2015-04-06-
dc.date.issued2015-04-03-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/69614-
dc.publisher한국전기화학회-
dc.relation.isPartOf2015년도 한국전기화학회 춘계총회 및 학술발표회-
dc.titleCharacterization and Microstructure Analysis of SiOx using Raman Spectroscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2015년도 한국전기화학회 춘계총회 및 학술발표회-
dc.citation.conferencePlaceKO-
dc.citation.title2015년도 한국전기화학회 춘계총회 및 학술발표회-
dc.contributor.affiliatedAuthor강병우-
dc.contributor.affiliatedAuthor유선영-
dc.contributor.affiliatedAuthor김정한-
dc.description.journalClass2-
dc.description.journalClass2-

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강병우KANG, BYOUNG WOO
Dept of Materials Science & Enginrg
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