Full metadata record
DC Field | Value | Language |
dc.contributor.author | 강병우 | - |
dc.contributor.author | 유선영 | - |
dc.contributor.author | 김정한 | - |
dc.date.accessioned | 2018-06-19T01:13:12Z | - |
dc.date.available | 2018-06-19T01:13:12Z | - |
dc.date.created | 2015-04-06 | - |
dc.date.issued | 2015-04-03 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/69614 | - |
dc.publisher | 한국전기화학회 | - |
dc.relation.isPartOf | 2015년도 한국전기화학회 춘계총회 및 학술발표회 | - |
dc.title | Characterization and Microstructure Analysis of SiOx using Raman Spectroscopy | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 2015년도 한국전기화학회 춘계총회 및 학술발표회 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 2015년도 한국전기화학회 춘계총회 및 학술발표회 | - |
dc.contributor.affiliatedAuthor | 강병우 | - |
dc.contributor.affiliatedAuthor | 유선영 | - |
dc.contributor.affiliatedAuthor | 김정한 | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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