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Length dependency expectation of negative bias temperature instability
- Title
- Length dependency expectation of negative bias temperature instability
- Date Issued
- 2015-11-02
- Publisher
- The Japan Society of Applied Physics
- Article Type
- Conference
- Citation
- International Workshop on Dielectric thin films for future electron devices(IWDTF), 2015-11-02
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg