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Self-Relaxed Conductive Filament in ReRAM Analyzed by In-situ TEM and Atom Probe Tomography
- Title
- Self-Relaxed Conductive Filament in ReRAM Analyzed by In-situ TEM and Atom Probe Tomography
- Date Issued
- 2015-11-24
- Publisher
- Japanese Society of Microscopy
- Article Type
- Conference
- Citation
- EAMC-2, 2015-11-24
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg