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Improvement in reliability characteristics (retention and endurance) of RRAM by using high-pressure hydrogen annealing

Title
Improvement in reliability characteristics (retention and endurance) of RRAM by using high-pressure hydrogen annealing
Authors
황현상
Date Issued
2015-02-12
Publisher
한국반도체연구조합
URI
https://oasis.postech.ac.kr/handle/2014.oak/71076
Article Type
Conference
Citation
제22회 한국반도체학술대회, 2015-02-12
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