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Multi-state resistance controllability and variability analysis of binary oxide RRAM for ultra-high density memory applications
- Title
- Multi-state resistance controllability and variability analysis of binary oxide RRAM for ultra-high density memory applications
- Authors
- 황현상
- Date Issued
- 2015-02-12
- Publisher
- 한국반도체연구조합
- Article Type
- Conference
- Citation
- 제22회 한국반도체학술대회, 2015-02-12
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Related Researcher
- 황현상HWANG, HYUNSANG
- Dept of Materials Science & Enginrg