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Investigation of oxide traps at SiC/SiO2 interfacial layer in SiC DMOSFET for high-power applications
- Title
- Investigation of oxide traps at SiC/SiO2 interfacial layer in SiC DMOSFET for high-power applications
- Authors
- 이정수
- Date Issued
- 2016-06-14
- Publisher
- NANO KOREA
- Article Type
- Conference
- Citation
- NANO KOREA 2016 Symposium, 2016-06-14
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg