Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Reliability Characteristics in Junctionless Poly-Si Thin-Film Transistors
- Title
- Reliability Characteristics in Junctionless Poly-Si Thin-Film Transistors
- Authors
- 이정수
- Date Issued
- 2016-02-22
- Publisher
- KCS
- Article Type
- Conference
- Citation
- 제23회 한국반도체학술대회 (KCS 2016), 2016-02-22
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg