Bias Dependent Channel Thermal Noise Modeling for RF MOSFET
- Title
- Bias Dependent Channel Thermal Noise Modeling for RF MOSFET
- Authors
- 김범만
- Date Issued
- 2005-05-01
- Publisher
- 대한전자공학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/73199
- Article Type
- Conference
- Citation
- 2005 춘계 마이크로파 및 전파 학회, page. 278 - 281, 2005-05-01
- Files in This Item:
- There are no files associated with this item.
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