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Parallely Testable Design for Detection of Neighborhood Pattern Senstive Faults in High Density DRAMs
- Title
- Parallely Testable Design for Detection of Neighborhood Pattern Senstive Faults in High Density DRAMs
- Authors
- 김주엽
- Date Issued
- 2005
- Publisher
- 포항공과대학교
- URI
- http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001907163
https://oasis.postech.ac.kr/handle/2014.oak/7381
- Article Type
- Thesis
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