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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 전치혁 | - |
| dc.date.accessioned | 2018-06-21T08:05:31Z | - |
| dc.date.available | 2018-06-21T08:05:31Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 1999-12-15 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/77700 | - |
| dc.publisher | Computers & Industrial Engineering | - |
| dc.relation.isPartOf | Proceedings of the 26th International Conference on Computers & Industrial Engineering | - |
| dc.relation.isPartOf | Proceedings of the 26th International Conference on Computers & Industrial Engineering | - |
| dc.title | A Class of Contagious Distributions and Semiconductor Yield Models | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Proceedings of the 26th International Conference on Computers & Industrial Engineering, pp.75 - 79 | - |
| dc.citation.conferencePlace | AT | - |
| dc.citation.endPage | 79 | - |
| dc.citation.startPage | 75 | - |
| dc.citation.title | Proceedings of the 26th International Conference on Computers & Industrial Engineering | - |
| dc.contributor.affiliatedAuthor | 전치혁 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg