Synchrotron x-ray reflectivity as a probe for nm-scale thin films
- Title
- Synchrotron x-ray reflectivity as a probe for nm-scale thin films
- Authors
- 이기봉
- Date Issued
- 1999-12-07
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/77704
- Article Type
- Conference
- Citation
- Discussion Meeting on Materials Research using Accelerator Facilities, 1999-12-07
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.