Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정석민 | - |
| dc.date.accessioned | 2018-06-21T08:19:13Z | - |
| dc.date.available | 2018-06-21T08:19:13Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 1999-07-19 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/77942 | - |
| dc.relation.isPartOf | 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy | - |
| dc.relation.isPartOf | 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Micro | - |
| dc.title | Roughness variation of stainless steel oxide film by oxidation | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy | - |
| dc.citation.title | 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy | - |
| dc.contributor.affiliatedAuthor | 정석민 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 정석민CHUNG, SUK MIN
- Dept of Physics