Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 전치혁 | - |
| dc.date.accessioned | 2018-06-21T08:27:02Z | - |
| dc.date.available | 2018-06-21T08:27:02Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 1999-01-17 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/78090 | - |
| dc.publisher | SMOMS | - |
| dc.relation.isPartOf | Int'l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS'99) | - |
| dc.relation.isPartOf | Int'l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS'99) | - |
| dc.title | Semiconductor Yield Models Considering Cluster Effect and Fault Observation | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Int'l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS'99), pp.107 - 112 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 112 | - |
| dc.citation.startPage | 107 | - |
| dc.citation.title | Int'l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS'99) | - |
| dc.contributor.affiliatedAuthor | 전치혁 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg