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dc.contributor.author임근배-
dc.date.accessioned2018-06-21T08:48:28Z-
dc.date.available2018-06-21T08:48:28Z-
dc.date.created2009-03-27-
dc.date.issued1998-08-01-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/78472-
dc.publisherIEEE-
dc.relation.isPartOfProceedings of the 11th IEEE International Symposium on Application of Ferroelectrics (ISAF 1998)-
dc.relation.isPartOfProceedings of the 11th IEEE International Symposium on Application of Ferroelectrics (ISAF 1998)-
dc.titleAn Application of Polarized Domains in Ferro electric Thin Films using Scanning Probe Microscope-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationProceedings of the 11th IEEE International Symposium on Application of Ferroelectrics (ISAF 1998), pp.407 - 410-
dc.citation.conferencePlaceMX-
dc.citation.endPage410-
dc.citation.startPage407-
dc.citation.titleProceedings of the 11th IEEE International Symposium on Application of Ferroelectrics (ISAF 1998)-
dc.contributor.affiliatedAuthor임근배-
dc.description.journalClass1-
dc.description.journalClass1-

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Dept of Mechanical Enginrg
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