Does line edge roughness matter?: FEOL and BEOL perspectives
- Title
- Does line edge roughness matter?: FEOL and BEOL perspectives
- Authors
- 김형준
- Date Issued
- 2003-06-01
- Publisher
- SPIE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/79084
- Article Type
- Conference
- Citation
- Advances in Resist Technology and Processing, page. 1076 - 1085, 2003-06-01
- Files in This Item:
- There are no files associated with this item.
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