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Does line edge roughness matter?: FEOL and BEOL perspectives

Title
Does line edge roughness matter?: FEOL and BEOL perspectives
Authors
김형준
Date Issued
2003-06-01
Publisher
SPIE
URI
https://oasis.postech.ac.kr/handle/2014.oak/79084
Article Type
Conference
Citation
Advances in Resist Technology and Processing, page. 1076 - 1085, 2003-06-01
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김형준KIM, HYUNGJUN
Dept of Materials Science & Enginrg
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