SrTiO3표면의 계단구조에 대한 X선 회절분석

Abstract

We carried out X-ray diffraction study which is sensitive to LaAlO3/SrTiO3 interface. We demonstrated by simulation that diffraction from stepped surface is sensitive to interface. We prepared high quality stepped surfaces of SrTiO3 and observed characteristics of stepped surface of SrTiO3 by three different methods. First, we observed images of stepped structure by atomic force microscopy. And we measured diffraction intensities from stepped surface using soft X-ray scattering and we confirmed average period of the stepped structures. Finally, crystal truncation rod scans using hard X-ray provided consistent results. We determined height and width of stepped structure of SrTiO3 surface and confirmed that this result is entirely consistent with previous results. These studies in this thesis have been done as a preliminary step to study LaAlO3/SrTiO3 interface. We expect to confirm orbital reconstruction of LaAlO3/SrTiO3 interface using LaAlO3/SrTiO3 sample which is grown on the same SrTiO3 substrate.