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dc.contributor.author정윤하-
dc.date.accessioned2018-06-21T12:09:03Z-
dc.date.available2018-06-21T12:09:03Z-
dc.date.created2009-03-27-
dc.date.issued2004-06-07-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/81083-
dc.publisherCosta Mesa, California-
dc.relation.isPartOfPreceedings of the SEM X international congress & exposition on experimental & applied mechanics-
dc.relation.isPartOfPreceedings of the SEM X international congress & exposition on experimental & applied mechanics-
dc.titleInvited : Characterization of functional nanodevices : QD, Qubit, and Nanowire-HEMT-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationPreceedings of the SEM X international congress & exposition on experimental & applied mechanics-
dc.citation.conferenceDate2004-06-07-
dc.citation.titlePreceedings of the SEM X international congress & exposition on experimental & applied mechanics-
dc.contributor.affiliatedAuthor정윤하-
dc.description.journalClass1-
dc.description.journalClass1-

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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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