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Boron Surface Segregation and Film Growth Kinetics during Ultra Highly Doped Si1-xGex(001):B Gas-Source Molecular Beam Epitaxy

Title
Boron Surface Segregation and Film Growth Kinetics during Ultra Highly Doped Si1-xGex(001):B Gas-Source Molecular Beam Epitaxy
Authors
김형준
Date Issued
2001-05-01
Publisher
Material Research Society
URI
https://oasis.postech.ac.kr/handle/2014.oak/81143
Article Type
Conference
Citation
Materials Research Society Spring Meeting, 2001-05-01
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김형준KIM, HYUNGJUN
Dept of Materials Science & Enginrg
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