Boron Surface Segregation and Film Growth Kinetics during Ultra Highly Doped Si1-xGex(001):B Gas-Source Molecular Beam Epitaxy
- Title
- Boron Surface Segregation and Film Growth Kinetics during Ultra Highly Doped Si1-xGex(001):B Gas-Source Molecular Beam Epitaxy
- Authors
- 김형준
- Date Issued
- 2001-05-01
- Publisher
- Material Research Society
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/81143
- Article Type
- Conference
- Citation
- Materials Research Society Spring Meeting, 2001-05-01
- Files in This Item:
- There are no files associated with this item.
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