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dc.contributor.author임근배-
dc.date.accessioned2018-06-21T12:26:59Z-
dc.date.available2018-06-21T12:26:59Z-
dc.date.created2009-03-27-
dc.date.issued1999-03-01-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/81400-
dc.publisherSPIE Smart Structures and Materials,-
dc.relation.isPartOfSPIE Smart Structures and Materials-
dc.relation.isPartOfSPIE Smart Structures and Materials, Newport Beach, Ca-
dc.titleFormation and observation of ferroelectric domains in PbZr1-x TixO3 (PZT) thin films using atomic force microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationSPIE Smart Structures and Materials, pp.94 - 102-
dc.citation.conferencePlaceUS-
dc.citation.endPage102-
dc.citation.startPage94-
dc.citation.titleSPIE Smart Structures and Materials-
dc.contributor.affiliatedAuthor임근배-
dc.description.journalClass1-
dc.description.journalClass1-

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임근배LIM, GEUN BAE
Dept of Mechanical Enginrg
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