Observation of inductively-coupled-plasma-induced damages in n-type GaN using deep-level transient spectroscopy
- Title
- Observation of inductively-coupled-plasma-induced damages in n-type GaN using deep-level transient spectroscopy
- Authors
- 이종람
- Date Issued
- 2002-07-01
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/82195
- Article Type
- Conference
- Citation
- The international workshop on Nitride Semiconductors, 2002-07-01
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.