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Statistical Estimation of Leakage Current for VLSI Circuits under Process Variation
- Title
- Statistical Estimation of Leakage Current for VLSI Circuits under Process Variation
- Authors
- 도경태
- Date Issued
- 2007
- Publisher
- 포항공과대학교
- URI
- http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001908057
https://oasis.postech.ac.kr/handle/2014.oak/8274
- Article Type
- Thesis
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