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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 문원규 | - |
| dc.date.accessioned | 2018-06-21T15:09:43Z | - |
| dc.date.available | 2018-06-21T15:09:43Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/83983 | - |
| dc.relation.isPartOf | 제8회 한국 MEMS 학술대회 | - |
| dc.relation.isPartOf | 제8회 한국 MEMS 학술대회 | - |
| dc.title | MOS 트랜지스터와 FIB 탐침을 이용한 표면 전기 물성 측정용 프로브 개발 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 제8회 한국 MEMS 학술대회, pp.382 - 385 | - |
| dc.citation.conferenceDate | 2006-04-06 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.endPage | 385 | - |
| dc.citation.startPage | 382 | - |
| dc.citation.title | 제8회 한국 MEMS 학술대회 | - |
| dc.contributor.affiliatedAuthor | 문원규 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 문원규MOON, WON KYU
- Dept of Mechanical Enginrg